In the Linux kernel, the following vulnerability has been resolved:
soc: samsung: exynos-pmu: fix use-after-free of interrupt generator node
The setup_cpuhp_and_cpuidle() parses the device tree node for the
interrupt generation block via of_parse_phandle() and decrements its
reference count using of_node_put() immediately after fetching the resource
address. However, later the intr_gen_node pointer is passed into
of_syscon_register_regmap().
Fix this by declaring intr_gen_node with __free() and removing
of_node_put().
CVE-2026-98415
NONE
EPSS 0.21%
Updated Oct 19, 2026
Samsung
https://git.kernel.org/stable/c/164313e24cb0f51528bc2099c5564174ead11d8a
416baaa9-dc9f-4396-8d5f-8c081fb06d67
https://git.kernel.org/stable/c/4450102d6aa2a85b1d2d8610920fcbe45eb0ef69
416baaa9-dc9f-4396-8d5f-8c081fb06d67
https://git.kernel.org/stable/c/4dd1999783d7d12434006289338373e49492dc96
416baaa9-dc9f-4396-8d5f-8c081fb06d67
CVE Details
CVE ID
CVE-2026-98415
Published Date
Oct 14, 2026
Vendor
Samsung
Severity
NONE
Exploit Prediction (EPSS)
Probability of Exploit
0.21%
Likelihood of exploitation in next 30 days
Percentile:
10.2th percentile (higher than 10.2% of all CVEs)
Standard patching cycle
Impact
Minimal impact
Source
View Advisory